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1.Zoltan Sarkany, Andras Vass-Varnai, Marta Rencz (2013) Investigation of die-attach degradation using power cycling tests, Proceedings of 15th IEEE EPTC, pp 780 ¨C 784, Singapore.

2.Zoltan Sarkany, Andras Vass-Varnai, Sandor Laky, Marta Rencz (2014) Thermal Transient Analysis of Semiconductor Device Degradation in Power Cycling Reliability Tests with Variable Control Strategies, Proceedings of SEMI-THERM 30, pp. 236-241, San Jose CA.

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